JEDEC工业标准

JEDEC

工业标准

环境应力试验

[JDa1]

JESD22-A100-B

Cycled Temperature-Humidity-Bias Life Test

上电温湿度循环寿命试验

,

(Revision of JESD22-A100-A) April 2000 [

Text-jd001

]

[JDa2]

JESD22-A101-B

Steady State Temperature Humidity Bias Life Test

上电温湿度稳态寿命试验

,

(Revision of JESD22-A101-A) April 1997 [

Text-jd002

]

[JDa3]

JESD22-A102-C

Accelerated Moisture Resistance -Unbiased Autoclave

高加速蒸煮试验

,

(Revision of JESD22-A102-B) December 2000 [

Text-jd003

]

[JDa4]

JESD22-A103-A

Test Method A103-A High Temperature Storage Life

高温储存寿命试验

,

(Revision of Test Method A103 Previously Published in JESD22-B) July 1989 [

Text-jd004

]

[JDa5]

JESD22-A103-B

High Temperature Storage Life

高温储存寿命试验

, (Revision of JESD22-

A103-A) August 2001 [

Text-jd005

]

[JDa6]

JESD22-A104-B

Temperature Cycling

温度循环

, (Revision of JESD22-A104-A) July 2000 (

参

见更新版本

A104C) [

Text-jd006

]

[JDa7]

EIA/JESD22-A105-B

Test Method A105-B Power and Temperature Cycling

上电和温度循环

,

(Revision of Test Method A105-A) February 1996 [

Text- jd007

]

[JDa8]

JESD22-A106-A

Test Method A106-A Thermal Shock

热冲击

, (Revision of Test Method A106-

Previously Published in JESD22-B) April 1995 [

Text- jd008

]

[JDa9]

JESD22-A107-A

Salt Atmosphere

盐雾试验

, (Revision of Test Method A107-Previously

Published in JESD22-B) December 1989 [

Text- jd009

]

[JDa10]

JESD22-A108-B

Temperature, Bias, and Operating Life

高温环境条件下的工作寿命试验

,

(Revision of JESD22-A108-A) December 2000

[JDa11]

JESD22-A110-B

Test Method A110-B Highly-Accelerated Temperature and Humidity Stress

Test (HAST)

高加速寿命试验

, (Revision of Test Method A110-A) February 1999 [

Text-jd010

]

[JDa12]

JESD22-A113-B

Preconditioning of Nonhermetic Surface Mount Devices Prior to Reliability

Testing

非密封表贴器件在可靠性试验以前的预处理

, (Revision of Test Method A113-A)

March 1999 [

Text-jd011

]

[JDa13]

JESD22-A118

Accelerated Moisture Resistance - Unbiased HAST

不上电的 高加速湿气渗透试

验

, December 2000 [

Text-jd012

]

[JDa14]

JESD22-B106-B

Test Method B106-B Resistance to Soldering Temperature for Through-Hole

Mounted Devices

插接器件的抗焊接温度试验

, (Revision of Test Method B106-A) February

1999 [

Text- jd013

]

[JDa15]

EIA/JESD47

Stress-Test- Driven Qualification of Integrated Circuits

集成电路施加应力的产品

验收试验

, July 1995 [

Text-jd031

]

[JDa1]

JESD22-A104C

Temperature Cycling, (Revision of JESD22-A104-B) May 2005 [

Text-jd040

]

电应力和电测试试验

[JDb1]

JESD22-A114-B

Electrostatic Discharge (ESD) Sensitivity Testing Human Body Model (HBM)

人体模型条件下的静电放电敏感度试验

, (Revision of JESD22-A114-A) June 2000 [

Text-jd014

]

[JDb2]

EIA/JESD22-A115-A

Electrostatic Discharge (ESD) Sensitivity Testing Machine Model (MM)

机器模型条件下的静电放电敏感度试验

, (Revision of EIA/JESD22-A115) October 1997 [

Text-

jd015

]

[JDb3]

JESD22-A117

Electrically Erasable Programmable ROM (EEPROM) Program/Erase Endurance

and Data Retention Test EEPROM

的擦涂和数据保存试验

, January 2000 [

Text-jd016

]

[JDb4]

EIA/JESD78

IC Latch-Up Test

集成电路器件闩锁试验

, March 1997 [

Text-jd017

]

[JDb5]

JESD22-C101-A

Field-Induced Charged-Device Model Test Method for Electrostatic-

Discharge-Withstand Thresholds of Microelectronic Components

微电子器件在电荷感应模型条

件下的抗静电放电试验

, (Revision of JESD22-C101) June 2000 [

Text-jd018

]

机械应力试验