MIL-STD-202G-Method-310(中文版)

:A(

見

3.1),

和

B(

見

3.2)

。測試電路的選擇取決於主要根據電

氣接觸的類型來做測試。

測試電路

B

是首選的

,

盡可能

,

以避免接觸形成的積炭造成的接觸

污染。特定規格應註明衝擊的監測和震動測試 時測試電路和持續時間的要求。呈列於此的

測試電路為建議的參考電路。任何類似的測試 電路都應符合本文中指定的測試要求和校正

程序

,

才能被用作使用測試。

2.1.1 Selection of test-circuit A. Test-circuit A is for monitoring test-specimens with a single set

of contacts, for the opening of normally-closed contacts or false closures of normally-

opened contacts (see figure 310-1). Test-circuit A should not be specified for specimens

whose capability includes low-level or dry-circuit ratings (10 milliamperes or less and 2

volts or less for openings or closings less than 10 microseconds); since the current through

the electrical contacts under test from the test- circuit may cause arcing, thus damaging the

contacts.

2.1.1

測試電路

A

的選擇。

測試電路

A

是對於監測樣品

-

單一組連接設定

,

如正常導通接觸的

斷開或正常切斷接觸時不 正確的導通

(

見圖

310-1)

。測試電路

A

不應指定測試樣品其

功能包含低等級或微電路等 級

(10mA

或更低和

2V

10?s

更低

)

；因為在測試情況下從測 試電路電流穿過電子觸點可能造成電弧

,

從而損壞接觸

觸點。

2.1.2 Selection of test-circuit B. Test-circuit B is for monitoring test-specimens with a single set

of contacts, for the opening of normally-closed contacts and false closures of normally-

open contacts (see figure 310-3). Test-circuit B should not be used for openings or closings

of less than 10 microseconds. Test-circuit B does not allow current in excess of 20

milliamperes or an open-circuit voltage in excess of 2-volts during monitoring; which

insures that there will be no arcing, which will cause damage, to low-level and dry-circuit

test specimens.

2.1.2

選擇測試電路

B

。

測試電路

B

是對於監 控測試樣品

-

一組接點設定

,

如正常導通接觸

(

見圖

310-3)

。測試電路

B

不應

使用於

切斷或

導通時間低於

10?s

的開關。測試電路

B

不允許測試電流超 過

20 m A

或

或在監測期間

開路電壓超過

2V;

在測試低等級和微電流的樣品期間

,

應保證樣品沒有電 弧和造成損害

發生。

註

: A-

低於切換時間

10?s ,B

-< /p>

不應低於切斷或導通時間低於

10?s。

3. TEST SYSTEMS.

3.

測試系統

3.1 Test-circuit A. The test circuit shall be the thyratron circuit shown on figure 310-1 or an

approved equivalent circuit. The values for R1, C1, and the suppressor grid-cathode voltage,

controlled by R7, principally controls the firing of the thyratron and are so chosen that the

thyratron will fire when the duration of the contact-opening exceeds the time- duration

specified in the individual specification (see 4.3 and 5). For the longer time-durations, such as

above 1 millisecond, it may be necessary to change the values of R2, R5, and R6.

3.1

測試電路

A

。測試電路應如圖

310-1

所示的閘流管電路或適當等效電路。

R1,C1< /p>

和抑制

< br>柵極電壓值由

R7

來作控制

,< /p>

主要是在控制閘流管的觸發和當接觸斷開超過在特定規

格指定的時間期間

,

閘流管將改變觸發

(

見

4.3

章和

5

章

< br>)

。對於較長的持續時間

,

如< /p>

1ms

以上

,

它需要改變

R2,R5

和

R6

的阻值。

a. To monitor normally-closed contacts, the normally-closed contacts are connected to BP1 and

BP2, with switch S1 in the

ground potential. The cathode of the thyratron is at a positive potential (depending on the

setting of R7), thus providing sufficient negative bias to cut the thyratron

chatter (opening of closed contacts) will cause the grid of the thyratron to rise exponentially

to +150 volts at a rate determined by the preselected time constant of R1 and C1. As long as

the contacts remain open, the grid potential will continue to rise. If the contacts remain

thyratron conducts and ionizes, thus lighting DS1. Since, in a thyratron, the grid loses control

of conduction as soon as the tube conducts, the contacts being monitored can reclose at any

time thereafter without affecting the monitoring circuit. Thus, lamp DS1 will remain

the thyratron is manually reset by operation of switch S2.

a.

監測 正常導通接觸

,

正常導通位置應是正常導通接點連接到